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KMID : 1102020180480040132
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Applied Microscopy
2018 Volume.48 No. 4 p.132 ~ p.133
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Grain Boundaries Imaged by Integration of Sobel Filtered Scanning Transmission Electron Micrographs
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Kang Min-Chul
Oh Jin-Su
Yang Cheol-Woong
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Abstract
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One of the most important factors determining the properties of a material is its grain size. However, unclear grain boundaries in the image hinder an accurate measurement of grain size. We demonstrate that grain boundaries existing in the images obtained by scanning transmission electron microscopy (STEM) can be clearly distinguished by applying a Sobel filter to a tilting series of STEM images of a hydrogenation-disproportionation-desorption-recombination processed Nd2Fe14B magnet sample.
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KEYWORD
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Sobel filter, Image processing, Poisson noise, Channeling contrast
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